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From IC Debug to Hardware Security Risk: The Power of Backside Access and Optical Interaction

C. Boit and S. Tajik and P. Scholz and E. Amini and A. Beyreuther and H. Lohrke and J.-P. Seifert

Proceedings of the 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2016). IEEE, 365-369. 2016

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Automated Detection of Fault Sensitive Locations for Reconfiguration Attacks on Programmable Logic

H. Lohrke and P. Scholz and C. Boit and S. Tajik and J.-P. Seifert

Proceedings of the 42nd International Symposium for Testing and Failure Analysis (ISTFA 2016). ASM International, 348-353. 2016

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Contactless Fault Isolation for FinFET Technologies with Visible Light and GaP SIL

H. Lohrke and P. Scholz and A. Beyreuther and U. Ganesh and E. Uhlmann and S. Kühne and M. Jogodzinski and Y. Iwaki and R. Chivas and S. Silverman and C. Boit

Proceedings of the 42nd International Symposium for Testing and Failure Analysis (ISTFA 2016). ASM International, 31-38. 2016

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No Place to Hide: Contactless Probing of Secret Data on FPGAs

H. Lohrke and S. Tajik and C. Boit and J. Seifert

International Conference on Cryptographic Hardware and Embedded Systems - CHES 2016. Springer, 147-167. 2016

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Sicherheitsrisiken durch IC-Debugger und Diagnose-Tools

C. Boit

25, SMARTCARD-Workshop Darmstadt 4. und 5. Feb. 2015. Fraunhofer Verlag, 30-35. 2015

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A Complete and Linear Physical Characterization Methodology for the Arbiter PUF Family

S. Tajik and E. Dietz and S. Frohmann and H. Dittrich and D. Nedospasov and C. Helfmeier and J. -P. Seifert and C. Boit and H.-W. Hübers

Proceedings of COSADE 2015. Springer, 1-2. 2015

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Laser Fault Attack on Physically Unclonable Functions

S. Tajik and H. Lohrke and F. Ganji and J. Seifert and C. Boit

Proceedings of the 2015 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC). IEEE computer society, 85-96. 2015

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Controlling the thermal impact of ns laser pulses for the preparation of the P2 interconnect by local phase transformation in CIGSe

C. Schultz and M. Schüle and K. Stelmaszczyk and M. Weizman and O. Gref and F. Friedrich and C. Wolf and C. Kaufmann and B. Rau and R. Schlatmann and F. Fink and B. Stegemann

Proceedings of the 42nd IEEE Photovoltaic Specialists Conference PVSC. IEEE Press, 1-4. 2015

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Contactless Visible Light Probing for Nanoscale ICs through 10 µm Bulk Silicon

C. Boit and H. Lohrke and P. Scholz and A. Beyreuther and U. Kerst and Y. Iwaki

Proceedings of the 35th Annual NANO Testing Symposium (NANOTS2015), 215-221. 2015

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Turning sample into (re)solution: Focused Ion Beam shaped Solid Immersion Lenses

P. Scholz and M. Sadowski and S. Kupijai and M. Henniges and C. Theiss and S. Meister and D. Stolarek and H. Richter and M. Boostandoost and C. Boit

Proceedings of the 41st International Symposium for Testing and Failure Analysis (ISTFA 2015). ASM International, 66-70. 2015

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A BIST structure for the evaluation of the MOSFET gate dielectric interface state density in post-processed CMOS chips

N. Dodel and S. Keil and A. Wiemhofer and M. Kortstock and P. Scholz and U. Kerst and R. Thewes

41st European Solid-State Circuits Conference (ESSCIRC), 412-415. 2015

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Physical Vulnerabilities of Physically Unclonable Functions

C. Helfmeier and D. Nedospasov and S. Tajik and C. Boit and J.-P. Seifert

Design, Automation and Test in Europe Conference and Exhibition (DATE). IEEE, 1-4. 2014

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Backside Failure Analysis Techniques: What's the Gain of Silicon Getting Thinner?

C. Boit and N. Schäfer and D. Abou-Ras and C. Helfmeier and A. Glowacki and U. Kerst

Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2014). IEEE, 17-21. 2014

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Emission Analysis of Hardware Implementations

S. Tajik and D. Nedospasov and C. Helfmeier and J.-P. Seifert and C. Boit

Proceedings of 17th EUROMICRO DSD, Verona (I), August 27-29, 2014. IEEE press, 528-534. 2014

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On the Origin of the Peak-and-Through Signal in the Grain-Boundary Light-Beam-Induced-Current Characterization Technique - 2D Numerical Simulations

A. Teodoreanu and R. Leihkauf and C. Boit and F. Friedrich and L. Korte

Proc. of 29th European Photovoltaic Solar Energy Conference and Exhibition - EU PVSEC. WIP Munich, 25-30. 2014

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Single image spectral electroluminescence (photon emission) of GaN HEMTs

P. Scholz and A. Glowacki and U. Kerst and C. Boit and P. Ivo and R. Lossy and H. Würfl and Y. Yokoyama

Proceedings of the 51st International Reliability Physics Symposium (IRPS 2013). IEEE Press, CD.3.1-CD.3.7. 2013

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Security Risks Posed By Modern IC Debug & Diagnosis Tools

C. Boit and C. Helfmeier and U. Kerst

Int. Workshop on Fault Diagnosis and Tolerance in Cryptography - FDTC 2013 2013

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Ultra High Precision Circuit Diagnosis Through Seebeck Generation and Charge Monitoring

C. Boit and C. Helfmeier and D. Nedospasos and A. Fox

Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013) 2013

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Feasibly Clonable Functions

C. Boit and C. Helfmeier and D. Nedospasov

Int. Workshop on Trustworthy Embedded Devices (TrustED '13) 2013

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Breaking and Entering through the Silicon

C. Helfmeier and C. Boit and D. Nedospasov and J. Krissler and J. Seifert and C. Tarnovsky

CCS' 2013, November 4-8, 2013, Berlin, Germany 2013

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Invasive PUF Analysis

D. Nedospasov and C. Helfmeier and J. Seifert and C. Boit

Int. Conference on Fault Diagnosis and Tolerance in Cryptography 2013 (FDTC 2013) 2013

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Modeling Infrastructure Along the Value Chain: from Materials to System Performance

Y. Augarten and W. Sprenger and B. Pieters and R. Varache and O. Bakaeva and G. Janssen and Y. Guanchao and F. Friedrich and M. Schmid and M. Celino and J. Hüpkes

Proc. of 28th European Photovoltaic Solar Energy Conference and Exhibition - EU PVSEC. WIP Munich, 3949-3952. 2013

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Study of minority carrier lifetime and absorber doping influence on the performance of chalcogenide solar cells with graded band gap

O. Bakaeva and F. Friedrich and R. Leihkauf and A. Teodoreanu and M. Boostandoost and T. Unold and C. Boit

Proceedings of 28th EU PVSEC. WIP Munich, 2370-2375. 2013

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Practical considerations in quantitative dark and illuminated lock-in thermography analyses of shunts in silicon thin-film modules

F. Friedrich and K. Mack and N. Krishnan and S. Kühnapfel and B. Stannowski and C. Schultz and R. Schlatmann and C. Boit

Proceedings of 28th EU PVSEC. WIP Munich, 2537-2541. 2013

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Cloning Physically Unclonable Functions

C. Helfmeier and C. Boit and D. Nedospasov and J. -P. Seifert

Proceedings of International Symposium on Hardware-Oriented Security and Trust (HOST) 2012. IEEE press, 1-6. 2013

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2D simulations of the grain boundary light beam induced current (GB-LBIC) technique on polycrystalline silicon thin film

A. Teodoreanu and F. Friedrich and L. Korte and R. Leihkauf and M. Kittler and B. Rech and C. Boit

Proceedings on 28th European Photovoltaic Solar Energy Conference and Ehibition (EU PVSEC 2013). WIP Munich, 2666-2670. 2013

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Short Circuit Current Loss Analysis of Electron Beam Crystallized Silicon Solar Cells on Glass by Numerical Computer Simulation

P. Reiss and J. Haschke and L. Korte and N. Mingirulli and D. Amkreutz and C. Leendertz and A.-M. Teodoreanu and B. Rech

Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition, 2396-2399. 2012

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Quantitative Aspects of Optical IC Debug Using State-of-the Art Backside Preparation

C. Boit and A. Glowacki and C. Pagano and U. Kerst and Y. Yokoyama

Proc. IEEE IPFA 2012. ASM int., 1-6. 2012

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Challenges for parametric analysis of the solar cells using failure analysis technique developed for the microelectronics

M. Boostandoost and X. Ycaza and R. Leihkauf and U. Kerst and C. Boit

Conference Proceedings from the 38th Int. Symp. for Testing and Failure Analysis (ISTFA 2012). ASM International, 255-263. 2012

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Photon emission spectra of FETs as obtained by InGaAs detector

A. Glowacki and C. Boit and Y. Yokoyama and P. Perdu

Conference Proceedings from the 38th Int. Symp. for Testing and Failure Analysis (ISTFA 2012). ASM International, 123-125. 2012

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On charge sensors for FIB attack detection

C. Helfmeier and C. Boit and U. Kerst

Proceedings of International Symposium on Hardware-Oriented Security and Trust (HOST) 2012. IEEE press, 128-133. 2012

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Chemical Gradients in Cu(In,Ga)(S,Se)2 Thin-Film Solar Cells: Results of the GRACIS Project

W. Witte and M. Powalla and H. Dimitrios and A. Eicke and M. Botros and H. Schock and R. Abou-Ras and T. Unold and . et al.

EU PVSEC Proceedings. EU PV SEC, 2166-2173. 2012

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Monitoring of the formation of a photosensitive device by electric breakdown of an impurity containing oxide in a MOS capacitor

R. Di Giacomo and G. Landi and C. Boit and H. Neitzert

SPIE Proceedings - Advanced Fabrication Technologies for Micro/Nano Optics and Photonics V 2012

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Investigation of Enhanced Photocurrent at the Grain Boundary of Thin Film Polycrystalline Silicon Solar Cells by Infrared LBIC

M. Boostandoost and F. Friedrich and U. Kerst and U. Boit and S. Gall

26th European Photovoltaic Solar Energy Conference. WIP-Munich.de, 2791-2795. 2011

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Can illuminated IV-characteristics of micro-regions in solar cells be measured by laser-induced stimulation?

M. Boostandoost and A. Glowacki and O. Bakaeva and U. Kerst and C. Boit

Proceedings of the 37th International Symposium for Testing and Failure Analysis (ISTFA 2011). ASM International, 330-335. 2011

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Effect of compositional gradients on structural defects in Cu(In,Ga)Se2 thin films for solar cells

J. Dietrich and D. Abou-Ras and T. Rissom and T. Unold and H. Schock and C. Boit

Proceedings of 37th IEEE Photovoltaic Specialists Conference (PVSC 2011). IEEE press, 343-347. 2011

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Spectral resolution of photon emission from SiGe:C heterojunction bipolar transistors (HBTs)

U. Kindereit and O. Mutihac and C. Boit and B. Tillack

Proceedings of the 49th International Reliability Physics Symposium (IRPS 2011). IEEE print, 514-519. 2011

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Detecting Laser Beam Reflectance Modulated by Electronic Device Operation with a Simple Setup

C. Pagano and C. Boit and Y. Yokoyama

Proceedings of the 49th International Reliability Physics Symposium (IRPS 2011). IEEE print, 774-779. 2011

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Instant Solid Immersion Lens creation in silicon with a Focused Ion Beam - comparing refractive and diffractive methods

P. Scholz and U. Kerst and T. Kujawa and T. Lundquist and C. Boit

Proceedings of the 37th International Symposium for Testing and Failure Analysis (ISTFA 2011). ASM International, 46-53. 2011

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Experimental investigation of laser beam transmission and focusing inside of mediums

C. Boit and V. Dallakyan and V. Gomtsyan and T. Karapetyan and U. Kerst and V. Rashoyan and R. Vardanyan

Proceedings of Engineering Academy of Armenia. Elsevier, 332-337. 2010

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Computer-aided analysis of laser beam transmission and focusing inside of materials

C. Boit and V. Dallakyan and U. Kerst and R. Vardanyan

Proceedings of Engineering Academy of Armenia. Elsevier, 531-535. 2010

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Microscopic characterization of thin-film crystalline silicon solar cells by electroluminescence and infrared LBIC

M. Boostandoost and U. Kerst and C. Boit

Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion. WIP - Renewable Energies, 3556-3556. 2010

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Activation Energy Analysis of Dark and Laser Illuminated I-V Characteristics of Thin-Film Poly Silicon Solar Cells

M. Boostandoost and U. Kerst and C. Boit

Proceedings of the 36th International Symposium for Testing and Failure Analysis (ISTFA 2010). ASM International, 158-162. 2010

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Ultra-Low-k Porous SiCOH Dielectric Degradation Process before Breakdown

T. Breuer and U. Kerst and C. Boit and E. Langer and H. Ruelke

Proceedings of the 17th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010). IEEE Press, 91-96. 2010

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Ultra-Low-k Dielectric Degradation before Breakdown

T. Breuer and U. Kerst and C. Boit and E. Langer and H. Ruelke

Proceedings of the 48th International Reliability Physics Symposium (IRPS 2010). IEEE Society, 890-894. 2010

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Improvement of optical resolution through chip backside using FIB trenches

A. Glowacki and C. Helfmeier and U. Kerst and C. Boit

Proceedings of the 36th International Symposium for Testing and Failure Analysis (ISTFA 2010). ASM International, 176-180. 2010

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Timing Characterization of a Tester Operated Integrated Circuit by Continuous and Pulsed Laser Stimulation

T. Kiyan and C. Brillert and C. Boit

Proceedings of the 36th International Symposium for Testing and Failure Analysis (ISTFA 2010). ASM International, 211-216. 2010

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Developing a Chemistry-Assisted Focused Ion Beam Process for 'On-Demand' Solid Immersion Lenses in Silicon

P. Scholz and U. Kerst and T. Kujawa and T. Lundquist and C. Boit

Proceedings of the 36th International Symposium for Testing and Failure Analysis (ISTFA 2010). ASM International, 389-392. 2010

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Analysis of poly-Si thin film solar cells by IR-LBIC

M. Boostandoost and H. Lin and U. Kerst and C. Boit

Proceedings of the 35th International Symposium for Testing and Failure Analysis (ISTFA 2009). ASM International, 157-161. 2009

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Influence of GaN cap on robustness of AlGaN/GaN HEMTs

P. Ivo and A. Glowacki and E. Bahat-Treidel and R. Pazirandeh and R. Lossy and J. Würfl and G. Tränkle and C. Boit

Proceedings of the 47th International Reliability Physics Symposium (IRPS 2009). IEEE Press, 71-75. 2009

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Prof. Dr. Christian Boit
Room E 103
Tel +4930 314-25520

Address

Technische Universität Berlin
Department of Semiconductor Devices
sec. E4
Einsteinufer 19
10587 Berlin