C. Schultz and M. Schuele and K. Stelmaszczyk and M. Weizman and O. Gref and F. Friedrich and C. Wolf and N. Papathanasiou and C. Kaufmann and B. Rau and R. Schlatmann and V. Quaschning and F. Fink and B. Stegemann

Solar Energy Materials & Solar Cells, 636-643. 2016

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From IC Debug to Hardware Security Risk: The Power of Backside Access and Optical Interaction

C. Boit and S. Tajik and P. Scholz and E. Amini and A. Beyreuther and H. Lohrke and J.-P. Seifert

Proceedings of the 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2016). IEEE, 365-369. 2016

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Automated Detection of Fault Sensitive Locations for Reconfiguration Attacks on Programmable Logic

H. Lohrke and P. Scholz and C. Boit and S. Tajik and J.-P. Seifert

Proceedings of the 42nd International Symposium for Testing and Failure Analysis (ISTFA 2016). ASM International, 348-353. 2016

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Contactless Fault Isolation for FinFET Technologies with Visible Light and GaP SIL

H. Lohrke and P. Scholz and A. Beyreuther and U. Ganesh and E. Uhlmann and S. Kühne and M. Jogodzinski and Y. Iwaki and R. Chivas and S. Silverman and C. Boit

Proceedings of the 42nd International Symposium for Testing and Failure Analysis (ISTFA 2016). ASM International, 31-38. 2016

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No Place to Hide: Contactless Probing of Secret Data on FPGAs

H. Lohrke and S. Tajik and C. Boit and J. Seifert

International Conference on Cryptographic Hardware and Embedded Systems - CHES 2016. Springer, 147-167. 2016

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2015

Sicherheitsrisiken durch IC-Debugger und Diagnose-Tools

C. Boit

25, SMARTCARD-Workshop Darmstadt 4. und 5. Feb. 2015. Fraunhofer Verlag, 30-35. 2015

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A Complete and Linear Physical Characterization Methodology for the Arbiter PUF Family

S. Tajik and E. Dietz and S. Frohmann and H. Dittrich and D. Nedospasov and C. Helfmeier and J. -P. Seifert and C. Boit and H.-W. Hübers

Proceedings of COSADE 2015. Springer, 1-2. 2015

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Laser Fault Attack on Physically Unclonable Functions

S. Tajik and H. Lohrke and F. Ganji and J. Seifert and C. Boit

Proceedings of the 2015 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC). IEEE computer society, 85-96. 2015

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Controlling the thermal impact of ns laser pulses for the preparation of the P2 interconnect by local phase transformation in CIGSe

C. Schultz and M. Schüle and K. Stelmaszczyk and M. Weizman and O. Gref and F. Friedrich and C. Wolf and C. Kaufmann and B. Rau and R. Schlatmann and F. Fink and B. Stegemann

Proceedings of the 42nd IEEE Photovoltaic Specialists Conference PVSC. IEEE Press, 1-4. 2015

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Electron-beam-induced current measurements with applied bias provide insight to locally resolved acceptor concentrations at p-n junctions

D. Abou-Ras and N. Schäfer and N. Baldaz and S. Brunken and C. Boit

AIP Advances, 077191-1-7. 2015

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On the Plasma Chemistry During Plasma Enhanced Chemical Vapor Deposition of Microcrystalline Silicon Oxides

O. Gabriel and S. Kirner and M. Klingsporn and F. Friedrich and B. Stannowski and R. Schlatmann

Plasma Processes and Polimers, 82-91. 2015

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Investigation of laser-fired point contacts on KOH structured laser-crystallized silicon by conductive atomic force microscopy

O. Gref and M. Weizman and H. Rhein and O. Gabriel and U. Gernert and R. Schlatmann and C. Boit and F. Friedrich

Applied Surface Science, 1-2. 2015

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Ultra sensitive measurement of dielectric current under pulsed stress conditions

C. Helfmeier and A. Beyreuther and A. Fox and C. Boit

Microelectronics Reliability, 2254-2257. 2015

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Contactless Visible Light Probing for Nanoscale ICs through 10 µm Bulk Silicon

C. Boit and H. Lohrke and P. Scholz and A. Beyreuther and U. Kerst and Y. Iwaki

Proceedings of the 35th Annual NANO Testing Symposium (NANOTS2015), 215-221. 2015

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Turning sample into (re)solution: Focused Ion Beam shaped Solid Immersion Lenses

P. Scholz and M. Sadowski and S. Kupijai and M. Henniges and C. Theiss and S. Meister and D. Stolarek and H. Richter and M. Boostandoost and C. Boit

Proceedings of the 41st International Symposium for Testing and Failure Analysis (ISTFA 2015). ASM International, 66-70. 2015

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A BIST structure for the evaluation of the MOSFET gate dielectric interface state density in post-processed CMOS chips

N. Dodel and S. Keil and A. Wiemhofer and M. Kortstock and P. Scholz and U. Kerst and R. Thewes

41st European Solid-State Circuits Conference (ESSCIRC), 412-415. 2015

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2014

Gallium gradients in Cu(In,Ga)Se2 thin-film solar cells

W. Witte and D. Abou-Ras and K. Albe and G. Bauer and F. Bertram and C. Boit and R. Brüggemann and J. Christen and J. Dietrich and A. Eicke and D. Hariskos and M. Maiberg and R. Mainz and M. Meessen and M. Müller and O. Neumann and T. Orgis and S. Paetel and J. Pohl and H. Rodriguez-Alvarez and R. Scheer and H.-W. Schock and T. Unold and A. Weber and M. Powalla

Progress in Photovoltaics: Research and Applications 2014

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Micro-contacting of single and periodically arrayed columnar silicon structures by focused ion beam techniques

F. Friedrich and N. Herfurth and A. Teodoreanu and T. Sontheimer and V. Preidel and B. Rech and C. Boit

Applied Physics Letters 2014

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Investigation of multiwalled carbon nanotube interconnection geometry and electrical characteristics of an CNT-filled aluminum microgap

R. Di Giacomo and R. Adami and V. Speranza and C. Barone and S. Pagano and P. Sabatino and G. Carapella and H. Wegner and C. Boit and A. De Girolamo Del Mauro and H. Neitzert

Canadian Journal of Physics, 827-831. 2014

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Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se2 thin films

J. Dietrich and D. Abou-Ras and S. Schmidt and T. Rissom and T. Unold and O. Cojocaru-Miredin and T. Niemann and M. Lehmann and C. Koch and C. Boit

Journal of Applied Physics, 103507. 2014

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PECVD Intermediate and Absorber Layers Applied in Liquid-Phase Crystallized Silicon Solar Cells on Glass Substrates

O. Gabriel and T. Frijnts and S. Calnan and S. Ring and S. Kirner and A. Opitz and I. Rothert and H. Rhein and M. Zelt and K. Bhatti and J. Zollondz and A. Heidelberg and J. Haschke and D. Amkreutz and S. Gall and F. Friedrich and B. Stannowski and B. Rech and R. Schlatmann

IEEE Jornal of Photovoltaics, 1343-1348. 2014

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On the Plasma Chemistry During Plasma Enhanced Chemical Vapor Deposition of Microcrystallinge Silicon Oxides

O. Gabriel and S. Kirner and M. Klingsporn and F. Friedrich and B. Stannowski and R. Schlatmann

Plasma Processes and Polymers, 82-91. 2014

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Backside spectroscopic photon emission microscopy using intensified silicon CCD

A. Glowacki and C. Boit and P. Perdu and Y. Iwaki

Microelectronics Reliability, 2105-2108. 2014

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Investigation of Laser-fired Rear-side Point Contacts of Laser-crystallized Silicon Thin-film Solar Cells by Conductive Probe Atomic Force Microscopy

O. Gref and J. Sandström and M. Weizman and M. Rhein and S. Gall and R. Schlatmann and C. Boit and F. Friedrich

Energy Procedia, 76-80. 2014

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Focused ion beam contact to nonvolatile memory cells

C. Helfmeier and R. Schlangen and C. Boit

Microelectronics Reliability, 1798-1801. 2014

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Study on non-destructive identification of gallium concentration gradients in Cu(In, Ga)Se2 solar cells and their efficiency impact

C. Herzog and O. Bakaeva and C. Boit and B. Kanngießer and F. Friedrich

Applied Physics Letters, 43904. 2014

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Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - an adaptive calibration algorithm

P. Scholz and N. Herfurth and M. Sadowski and T. Lundquist and U. Kerst and C. Boit

Microelectronics Reliability, 1794-1797. 2014

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Physical Vulnerabilities of Physically Unclonable Functions

C. Helfmeier and D. Nedospasov and S. Tajik and C. Boit and J.-P. Seifert

Design, Automation and Test in Europe Conference and Exhibition (DATE). IEEE, 1-4. 2014

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Backside Failure Analysis Techniques: What's the Gain of Silicon Getting Thinner?

C. Boit and N. Schäfer and D. Abou-Ras and C. Helfmeier and A. Glowacki and U. Kerst

Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2014). IEEE, 17-21. 2014

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Emission Analysis of Hardware Implementations

S. Tajik and D. Nedospasov and C. Helfmeier and J.-P. Seifert and C. Boit

Proceedings of 17th EUROMICRO DSD, Verona (I), August 27-29, 2014. IEEE press, 528-534. 2014

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On the Origin of the Peak-and-Through Signal in the Grain-Boundary Light-Beam-Induced-Current Characterization Technique - 2D Numerical Simulations

A. Teodoreanu and R. Leihkauf and C. Boit and F. Friedrich and L. Korte

Proc. of 29th European Photovoltaic Solar Energy Conference and Exhibition - EU PVSEC. WIP Munich, 25-30. 2014

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Physical Characterization of Arbiter PUFs

S. Tajik and E. Dietz and J.-P. Seifert and D. Nedospasov and S. Frohmann and C. Helfmeier and H. Dittrich and C. Boit

Cryptographic Hardware and Embedded Systems – CHES 2014. Springer, 493-509. 2014

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2013

The Influence of Space Charge Regions on Effective Charge Carrier Lifetime in Thin Films and Resulting Opportunities for Materials Characterization

C. Leendertz and A.-M. Teodoreanu and L. Korte and B. Rech

Journal of Applied Physics, 44510-1-44510-10. 2013

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An Effective Medium Approach for Modelling Polycrystalline Silicon Thin Film Solar Cells

A.-M. Teodoreanu and C. Leendertz and T. Sontheimer and L. Korte and B. Rech

Solar Energy Materials and Solar Cells, 152-160. 2013

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2D Modelling of Polycrystalline Silicon Thin Film Solar Cells

A.-M. Teodoreanu and F. Friedrich and R. Leihkauf and C. Boit and C. Leendertz and L. Korte

EPJ Photovoltaics, 45104-p1-45104-p6. 2013

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Single image spectral electroluminescence (photon emission) of GaN HEMTs

P. Scholz and A. Glowacki and U. Kerst and C. Boit and P. Ivo and R. Lossy and H. Würfl and Y. Yokoyama

Proceedings of the 51st International Reliability Physics Symposium (IRPS 2013). IEEE Press, CD.3.1-CD.3.7. 2013

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Bio-Nano-Composite Materials Constructed With Single Cells and Carbon Nanotubes: Mechanical, Electrical, and Optical Properties

R. Di Giacomo and B. Maresca and M. Angelillo and G. Landi and A. Leone and M. Vaccaro and C. Boit and A. Porta and H. Neitzert

IEEE Transactions on Nanotechnology, 1026-1030. 2013

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Growth process of microcrystalline silicon studies by combines photoluminescence and Raman investigations

A. Klossek and D. Mankovics and T. Arguirov and M. Ratzke and S. Kirner and F. Friedrich and O. Gabriel and B. Stannowski and R. Schlatmann and M. Kittler

Journal of Applied Physics, 223511-1-223511-6. 2013

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Security Risks Posed By Modern IC Debug & Diagnosis Tools

C. Boit and C. Helfmeier and U. Kerst

Int. Workshop on Fault Diagnosis and Tolerance in Cryptography - FDTC 2013 2013

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Ultra High Precision Circuit Diagnosis Through Seebeck Generation and Charge Monitoring

C. Boit and C. Helfmeier and D. Nedospasos and A. Fox

Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013) 2013

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Feasibly Clonable Functions

C. Boit and C. Helfmeier and D. Nedospasov

Int. Workshop on Trustworthy Embedded Devices (TrustED '13) 2013

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Breaking and Entering through the Silicon

C. Helfmeier and C. Boit and D. Nedospasov and J. Krissler and J. Seifert and C. Tarnovsky

CCS' 2013, November 4-8, 2013, Berlin, Germany 2013

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Invasive PUF Analysis

D. Nedospasov and C. Helfmeier and J. Seifert and C. Boit

Int. Conference on Fault Diagnosis and Tolerance in Cryptography 2013 (FDTC 2013) 2013

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Modeling Infrastructure Along the Value Chain: from Materials to System Performance

Y. Augarten and W. Sprenger and B. Pieters and R. Varache and O. Bakaeva and G. Janssen and Y. Guanchao and F. Friedrich and M. Schmid and M. Celino and J. Hüpkes

Proc. of 28th European Photovoltaic Solar Energy Conference and Exhibition - EU PVSEC. WIP Munich, 3949-3952. 2013

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