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Zeitschriften

FA Tools and IC Security

C. Boit and P. Scholz

Electronic Device Failure Analysis, 2,49. 2016

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Grain boundary light beam induced current: A characterization of bonded silicon wafers and polycrystalline silicon thin films for diffusion length extraction

O. Gref and A. Teodoreanu and R. Leihkauf and H. Lohrke and M. Kittler and D. Amkreutz and C. Boit and F. Friedrich

Phys. Status Solidi, 1728-1737. 2016

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Investigation of laser-fired point contacts on KOH structured laser-crystallized silicon by conductive atomic force microscopy

O. Gref and M. Weizman and H. Rhein and O. Gabriel and U. Gernert and R. Schlatmann and C. Boit and F. Friedrich

Applied Surface Science, 243-247. 2016

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Laser-induced local phase transformation of CIGSe for monolithic serial interconnection: Analysis of the material properties

C. Schultz and M. Schuele and K. Stelmaszczyk and M. Weizman and O. Gref and F. Friedrich and C. Wolf and N. Papathanasiou and C. Kaufmann and B. Rau and R. Schlatmann and V. Quaschning and F. Fink and B. Stegemann

Solar Energy Materials & Solar Cells, 636-643. 2016

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On the Plasma Chemistry During Plasma Enhanced Chemical Vapor Deposition of Microcrystalline Silicon Oxides

O. Gabriel and S. Kirner and M. Klingsporn and F. Friedrich and B. Stannowski and R. Schlatmann

Plasma Processes and Polimers, 82-91. 2015

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Investigation of laser-fired point contacts on KOH structured laser-crystallized silicon by conductive atomic force microscopy

O. Gref and M. Weizman and H. Rhein and O. Gabriel and U. Gernert and R. Schlatmann and C. Boit and F. Friedrich

Applied Surface Science, 1-2. 2015

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Ultra sensitive measurement of dielectric current under pulsed stress conditions

C. Helfmeier and A. Beyreuther and A. Fox and C. Boit

Microelectronics Reliability, 2254-2257. 2015

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Gallium gradients in Cu(In,Ga)Se2 thin-film solar cells

W. Witte and D. Abou-Ras and K. Albe and G. Bauer and F. Bertram and C. Boit and R. Brüggemann and J. Christen and J. Dietrich and A. Eicke and D. Hariskos and M. Maiberg and R. Mainz and M. Meessen and M. Müller and O. Neumann and T. Orgis and S. Paetel and J. Pohl and H. Rodriguez-Alvarez and R. Scheer and H.-W. Schock and T. Unold and A. Weber and M. Powalla

Progress in Photovoltaics: Research and Applications 2014

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Micro-contacting of single and periodically arrayed columnar silicon structures by focused ion beam techniques

F. Friedrich and N. Herfurth and A. Teodoreanu and T. Sontheimer and V. Preidel and B. Rech and C. Boit

Applied Physics Letters 2014

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Investigation of multiwalled carbon nanotube interconnection geometry and electrical characteristics of an CNT-filled aluminum microgap

R. Di Giacomo and R. Adami and V. Speranza and C. Barone and S. Pagano and P. Sabatino and G. Carapella and H. Wegner and C. Boit and A. De Girolamo Del Mauro and H. Neitzert

Canadian Journal of Physics, 827-831. 2014

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Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se2 thin films

J. Dietrich and D. Abou-Ras and S. Schmidt and T. Rissom and T. Unold and O. Cojocaru-Miredin and T. Niemann and M. Lehmann and C. Koch and C. Boit

Journal of Applied Physics, 103507. 2014

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PECVD Intermediate and Absorber Layers Applied in Liquid-Phase Crystallized Silicon Solar Cells on Glass Substrates

O. Gabriel and T. Frijnts and S. Calnan and S. Ring and S. Kirner and A. Opitz and I. Rothert and H. Rhein and M. Zelt and K. Bhatti and J. Zollondz and A. Heidelberg and J. Haschke and D. Amkreutz and S. Gall and F. Friedrich and B. Stannowski and B. Rech and R. Schlatmann

IEEE Jornal of Photovoltaics, 1343-1348. 2014

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On the Plasma Chemistry During Plasma Enhanced Chemical Vapor Deposition of Microcrystallinge Silicon Oxides

O. Gabriel and S. Kirner and M. Klingsporn and F. Friedrich and B. Stannowski and R. Schlatmann

Plasma Processes and Polymers, 82-91. 2014

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Backside spectroscopic photon emission microscopy using intensified silicon CCD

A. Glowacki and C. Boit and P. Perdu and Y. Iwaki

Microelectronics Reliability, 2105-2108. 2014

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Investigation of Laser-fired Rear-side Point Contacts of Laser-crystallized Silicon Thin-film Solar Cells by Conductive Probe Atomic Force Microscopy

O. Gref and J. Sandström and M. Weizman and M. Rhein and S. Gall and R. Schlatmann and C. Boit and F. Friedrich

Energy Procedia, 76-80. 2014

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Focused ion beam contact to nonvolatile memory cells

C. Helfmeier and R. Schlangen and C. Boit

Microelectronics Reliability, 1798-1801. 2014

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Study on non-destructive identification of gallium concentration gradients in Cu(In, Ga)Se2 solar cells and their efficiency impact

C. Herzog and O. Bakaeva and C. Boit and B. Kanngießer and F. Friedrich

Applied Physics Letters, 43904. 2014

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Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - an adaptive calibration algorithm

P. Scholz and N. Herfurth and M. Sadowski and T. Lundquist and U. Kerst and C. Boit

Microelectronics Reliability, 1794-1797. 2014

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An Effective Medium Approach for Modelling Polycrystalline Silicon Thin Film Solar Cells

A.-M. Teodoreanu and C. Leendertz and T. Sontheimer and L. Korte and B. Rech

Solar Energy Materials and Solar Cells, 152-160. 2013

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2D Modelling of Polycrystalline Silicon Thin Film Solar Cells

A.-M. Teodoreanu and F. Friedrich and R. Leihkauf and C. Boit and C. Leendertz and L. Korte

EPJ Photovoltaics, 45104-p1-45104-p6. 2013

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Bio-Nano-Composite Materials Constructed With Single Cells and Carbon Nanotubes: Mechanical, Electrical, and Optical Properties

R. Di Giacomo and B. Maresca and M. Angelillo and G. Landi and A. Leone and M. Vaccaro and C. Boit and A. Porta and H. Neitzert

IEEE Transactions on Nanotechnology, 1026-1030. 2013

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Growth process of microcrystalline silicon studies by combines photoluminescence and Raman investigations

A. Klossek and D. Mankovics and T. Arguirov and M. Ratzke and S. Kirner and F. Friedrich and O. Gabriel and B. Stannowski and R. Schlatmann and M. Kittler

Journal of Applied Physics, 223511-1-223511-6. 2013

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Conduction and material transport phenomena of degradation in electrically stressed ultra low-k dielectric before breakdown

T. Breuer and U. Kerst and C. Boit and E. Langer and H. Ruelke and A. Fissel

Journal of Applied Physics, 124103-1-10. 2012

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Compositional Gradients in Cu(InGa)Se2 Thin Films for Solar Cells and Their Effects on Structural Defects

J. Dietrich and D. Abou-Ras and T. Rissom and T. Unold and H. Schock and C. Boit

IEEE Journal of Photovoltaics, 364-370. 2012

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Optimum Si thickness for backside detection of photon emission using Si-CCD

A. Glowacki and C. Boit and P. Perdu

Microelectronics Reliability, 2031-2034. 2012

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Comparison of FET-optical modulation for 1300 nm and 1064 nm Laser sources

C. Pagano and C. Boit and A. Glowacki and R. Leihkauf and Y. Yokoyama

Microelectronics Reliability, 2024-2030. 2012

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Baseline meets innovation: Technology transfer for high-efficiency thin-film Si and CIGS modules at PVcomB

B. Rau and F. Friedrich and N. Papathanasiou and C. Schultz and B. Stannowski and B. Szyszka and R. Schlatmann

Photovoltaics International, 99-106. 2012

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Testing and failure analysis of thin film solar cells

C. Boit and M. Boostandoost and F. Friedrich and A. Glowacki

Phys. Status Solidi C, 3005-3008. 2011

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Characterization of poly-Si thin-film solar cell functions and parameters with IR optical interaction techniques

M. Boostandoost and F. Friedrich and U. Kerst and C. Boit and S. Gall and Y. Yokoyama

Journal of Materials Science: Materials in Electronics, 1553-1579. 2011

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Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation

S. Brahma and A. Glowacki and R. Leihkauf and C. Boit

Microelectronics Reliability, 1632-1636. 2011

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Comparative study of alGaN/GaN HEMTS robustness versus buffer design variations by applying Electroluminescence and electrical measurements

P. Ivo and A. Glowacki and E. Bahat-Treidel and R. Lossy and J. Würfl and C. Boit and G. Tränkle

Microelectronics Reliability, 217-223. 2011

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Analysis of Cu(In,Ga)(S,Se)2 thin-film solar cells by means of electron microscopy

D. Abou-Ras and J. Dietrich and J. Kavalakkatt and M. Nichterwitz and S. Schmidt and C. Koch and R. Cabballero and J. Klaer and T. Rissom

Solar Energy Materials & Solar Cells, 1452-1462. 2010

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Extraction of local thin-film solar cell parameters by bias-dependent IR-LBIC

M. Boostandoost and U. Kerst and C. Boit

Microelectronics Reliability, 1899-1902. 2010

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Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments

P. Scholz and C. Gallrapp and U. Kerst and T. Lundquist and C. Boit

Microelectronics Reliability, 1523-1528. 2010

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Interaction induced transistion in the nanoporous TiO2/Pd-porphyrin system

P. Zabel and M. Funes and T. Dittrich and E. Durantini and L. Otero

Phys. Status Solidi C 7, 280-283. 2010

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Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTS with photon emission spectral signatures

A. Glowacki and P. Laskowski and C. Boit and P. Ivo and E. Bahat-Treidel and R. Pazirandeh and R. Lossy and J. Würfl and G. Tränkle

Microelectronics Reliability, 1211-1215. 2009

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Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing

R. Schlangen and R. Leihkauf and U. Kerst and T. Lundquist and P. Egger and C. Boit

Microelectronics Reliability, 1158-1164. 2009

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Physical IC Debug - Backside Approach and Nanoscale Challenge

C. Boit and R. Schlangen and A. Glowacki and U. Kindereit and T. Kiyan and U. Kerst and T. Lundquist and S. Kasapi and H. Suzuki

Advances in Radio Science, 265-272. 2008

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Physical Techniques for Chip-Backside IC Debug in Nanotechnologies

C. Boit and R. Schlangen and U. Kerst and T. Lundquist

IEEE Design & Test of Computers - Special Issue on Silicon Debug and Diagnosis, 250-257. 2008

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Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology

U. Kindereit and . Boit and U. Kerst and S. Kasapi and R. Ispasoiu and R. Ng and W. Lo

Microelectronics Reliability, 1322-1326. 2008

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Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits

P. Laskowski and A. Glowacki and C. Boit

Microelectronics Reliability, 1295-1299. 2008

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Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam

A. Glowacki and S. Brahma and H. Suzuki and C. Boit

IEEE Transactions on Device and Materials Reliability, 31-49. 2007

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Quantitative Investigation of Laser Beam Modulation in Electrically Active Devices as Used in Laser Voltage Probing

U. Kindereit and G. Woods and J. Tian and U. Kerst and R. Leihkauf and C. Boit

IEEE Transactions on Device and Materials Reliability, 19-30. 2007

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Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy

R. Schlangen and U. Kerst and C. Boit and T. Malik and R. Jain and T. Lundquist

Microelectronics Reliability, 1523-1528. 2007

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Contact to Contacts or Silicide by use of Backside FIB Circuit Edit allowing to approach every Active Circuit Node

R. Schlangen and P. Sadewater and U. Kerst and C. Boit

Microelectronics Reliability, 1489-1503. 2006

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Prof. Dr. Christian Boit
Raum E 103
Tel +4930 314-25520

Adresse

Technische Universität Berlin
Fachgebiet Halbleiterbauelemente
Sekr. E4
Einsteinufer 19
10587 Berlin